Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wafer-level burn-in and test

Wafer-level burn-in and test

US Patent 7688090 · Granted Mar 30, 2010

Estimated economic value: $2,624,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Filling systems and related container assemblies and methods2025
Damage prediction system using artificial intelligence2025
Damage prediction system using artificial intelligence2023
Damage prediction system using artificial intelligence2022
DEP force control and electrowetting control in different sections of the same m2021
Microfluidic devices with flexible optically transparent electrodes2021
Pens for biological micro-objects2020
Providing DEP manipulation devices and controllable electrowetting devices in th2019
Methods and apparatus for implementing telemetry applications on a subscriber id2018
Pens for biological micro-objects2018
Microfluidic devices with flexible optically transparent electrodes2016
Sharpened, oriented contact tip structures2015