Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for evaluating semiconductor layers

Method and apparatus for evaluating semiconductor layers

US Patent 7656514 · Granted Feb 2, 2010

Estimated economic value: $206,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor device2020
Stop control system for vehicle2017
Method for manufacturing semiconductor device2016
Stop control system for vehicle2016
Semiconductor device2015
High electron mobility transistor with shortened recovery time2015
Image reading apparatus, control apparatus and method, and computer readable med2015
Method of manufacturing semiconductor device2014
Semiconductor device having improved RF characteristics and moisture resistance 2014
Semiconductor device2014
Image reading apparatus and optical unit2014
Image reading apparatus and multilayer substrate2013