Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Pipelined scan structures for testing embedded cores

Pipelined scan structures for testing embedded cores

US Patent 7502979 · Granted Mar 10, 2009

Estimated economic value: $13,680,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for die testing2015
Integrated circuit with configurable test pins2012
Area-efficient memory built-in-self-test circuitry with advanced debug capabilit2012
Area-efficient memory built-in-self-test circuitry with advanced debug capabilit2011
Method and apparatus for routing efficient built-in self test for on-chip circui2010
Automatic test configuration generation facilitating repair of programmable circ2008
Constraint-driven test generation for programmable logic device integrated circu2008
Soft error tolerance for configuration memory in programmable devices2008
Apparatus and method for encrypting security sensitive data2007
Method and apparatus for monitoring yield of integrated circuits2007
Automatic testing for programmable networks of control signals2006
Failure isolation and repair techniques for integrated circuits2006