Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Micro-impact testing apparatus

Micro-impact testing apparatus

US Patent 7500378 · Granted Mar 10, 2009

Estimated economic value: $11,167,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Crackstop structures2025
Shielding elements for packages of semiconductor devices2023
Crackstop structures2023
Bonding structures of semiconductor devices2022
Bond pads of semiconductor devices2022
Wafer stack protection seal2017
Edge structure for backgrinding asymmetrical bonded wafer2017
Wafer stack protection seal2016
Powdered grip clamping force2013
Swivel jaw face for tensile and similar testing2009
Bend testing apparatus and method of carrying out the same2008
Bend testing apparatus and method of carrying out the same2008