Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of isolating sources of variance in parametric data

Method of isolating sources of variance in parametric data

US Patent 7454387 · Granted Nov 18, 2008

Estimated economic value: $5,408,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor layout context around a point of interest2024
Wideband acoustic positioning with precision calibration and joint parameter est2023
Simultaneous multi-layer fill generation2020
Wireless synchronized apparatus and system2018
Simultaneous multi-layer fill generation2017
Joint angle tracking with inertial sensors2017
Method and apparatus for continuous measurement of motor symptoms in parkinson's2016
System and apparatus for continuous monitoring of movement disorders2014
Wireless synchronized movement monitoring apparatus and system2014
Model-based design verification2013
Method and apparatus for assessment of fluid responsiveness2013
Wearable movement monitor docket station2012