Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › On-wafer test structures for differential signals

On-wafer test structures for differential signals

US Patent 7443186 · Granted Oct 28, 2008

Estimated economic value: $662,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Resilient electrical interposers, systems that include the interposers, and meth2018
High frequency interconnect structures, electronic assemblies that utilize high 2016
High frequency interconnect structures, electronic assemblies that utilize high 2016
Resilient electrical interposers, systems that include the interposers, and meth2015
Resilient electrical interposers, systems that include the interposers, and meth2015
Systems and methods for simultaneous optical testing of a plurality of devices u2014
Differential waveguide probe2011
Differential signal probing system2010
Differential signal probing system2010
Active wafer probe2010
Test structure and probe for differential signals2010
Calibration structures for differential signal probing2010