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Home › Techniques for mitigating, detecting, and correcting single event upset effects in systems using SRAM-based field programmable gate arrays

Techniques for mitigating, detecting, and correcting single event upset effects in systems using SRAM-based field programmable gate arrays

US Patent 7383479 · Granted Jun 3, 2008

Estimated economic value: $12,611,000 ⓘ

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