Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Testing memory units in a digital circuit

Testing memory units in a digital circuit

US Patent 7343532 · Granted Mar 11, 2008

Estimated economic value: $252,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for testing semiconductor dies2018
Method for testing semiconductor dies and a test apparatus2016
Data processing circuit apparatus having a data transmission unit of redundant d2008
Monitoring device for monitoring internal signals during initialization of an el2008
Electronic circuit apparatus and method for stacking electronic circuit units2008
Integrated memory and method for testing the memory2007
Memory device with multistage sense amplifier2007
Test apparatus and method for testing circuit units to be tested2007
Method and apparatus for testing circuit units to be tested with different test 2007
Apparatus and method for testing circuit units to be tested2007
Method for testing an electric circuit2007
Circuit and method for testing a circuit having memory array and addressing and 2007