Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test apparatus and method for testing circuit units to be tested

Test apparatus and method for testing circuit units to be tested

US Patent 7276896 · Granted Oct 2, 2007

Estimated economic value: $631,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for testing semiconductor dies2018
Method for testing semiconductor dies and a test apparatus2016
Press-in pin for an electrical press-in connection between an electronic compone2016
Laser apparatus and method for processing objects with a laser which is controll2014
Control unit for personal protection device for a vehicle and method for assembl2014
Memory module system2014
Control unit for occupant protection means for a vehicle and a method for assemb2013
Control device module, especially in or for a motor vehicle2012
Adapter card for connection to a data bus in a data processing unit and method f2009
Data processing circuit apparatus having a data transmission unit of redundant d2008
Testing memory units in a digital circuit2008
Monitoring device for monitoring internal signals during initialization of an el2008