Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Calibration standard for transmission electron microscopy

Calibration standard for transmission electron microscopy

US Patent 7291849 · Granted Nov 6, 2007

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor devices with a sloped surface2021
Power unit with an integrated pull-down transistor2020
Source down power FET with integrated temperature sensor2020
Switching field plate power MOSFET2020
Power MOSFET with a deep source contact2020
Power MOSFET with metal filled deep source contact2020
Source down power FET with integrated temperature sensor2020
Integrated transistor and protection diode and fabrication method2020
Integrated transistor and protection diode and fabrication method2020
Integrated transistor and protection diode and fabrication method2019
Power MOSFET with a deep source contact2018
System and method for providing an electron blocking layer with doping control2018