Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test system and method for testing a circuit

Test system and method for testing a circuit

US Patent 7281184 · Granted Oct 9, 2007

Estimated economic value: $531,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Electronic circuit apparatus and method for stacking electronic circuit units2008
Integrated memory and method for testing the memory2007
Memory device with multistage sense amplifier2007
Method for activating and deactivating electronic circuit units and circuit arra2007
Method for testing a memory device and memory device for carrying out the method2007
Electronic memory apparatus, and method for deactivating redundant bit lines or 2007
Method for testing a semiconductor memory having a plurality of memory banks2006
RAM memory circuit having a plurality of banks and an auxiliary device for testi2005
Method and circuit configuration for identifying an operating property of an int2004