Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Circuit and method for configuring CAM array margin test and operation

Circuit and method for configuring CAM array margin test and operation

US Patent 7254753 · Granted Aug 7, 2007

Estimated economic value: $1,952,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Temperature differential-based voltage offset control2024
Clamp circuit with fuse options2008
Communication device for a logic circuit2007
Communication device for a logic circuit2006
Circuit and method for measuring and forcing an internal voltage of an integrate2005
Controller for delay locked loop circuits2005
Clamp circuit with fuse options2005
High density dynamic ternary-CAM memory architecture2005
Split word line ternary CAM architecture2004
Method of reducing standby current during power down mode2004
Method for contact pad isolation2004
Controller for delay locked loop circuits2004