Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Resistance defect assessment device, resistance defect assessment method, and method for manufacturing resistance defect assessment device

Resistance defect assessment device, resistance defect assessment method, and method for manufacturing resistance defect assessment device

US Patent 7253436 · Granted Aug 7, 2007

Estimated economic value: $351,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Field effect transistors with dual silicide contact structures2025
Contact plugs for semiconductor device and method of forming same2025
Memory array circuit and method of manufacturing same2025
Semiconductor structure and method for manufacturing the same2025
Selective dual silicide formation2025
Semiconductor device with source/drain contact formed using bottom-up deposition2025
Selective dual silicide formation using a maskless fabrication process flow2025
Channel mobility improvement2024
Substrate processing method and substrate processing apparatus2024
Interface profile control in epitaxial structures for semiconductor devices2024
Contact structures with deposited silicide layers2024
Memory array circuit and method of manufacturing same2024