Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Techniques for analyzing data generated by instruments

Techniques for analyzing data generated by instruments

US Patent 7231324 · Granted Jun 12, 2007

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for measuring a sample by x-ray reflectance scatterometry2025
Systems and approaches for semiconductor metrology and surface analysis using se2024
Patterned x-ray emitting target2024
Systems and approaches for semiconductor metrology and surface analysis using se2023
Feed-forward of multi-layer and multi-process information using XPS and XRF tech2023
Core-shell morphology of composite filaments for use in extrusion-based additive2023
Systems and approaches for semiconductor metrology and surface analysis using Se2022
Method of printing parts with a high-performance consumable materials with elect2021
Feed-forward of multi-layer and multi-process information using XPS and XRF tech2021
Systems and approaches for semiconductor metrology and surface analysis using se2021
Methods and systems for measuring periodic structures using multi-angle x-ray re2020
Feed-forward of multi-layer and multi-process information using XPS and XRF tech2020