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Home › Method and system for coding test pattern for scan design

Method and system for coding test pattern for scan design

US Patent 7225376 · Granted May 29, 2007

Estimated economic value: $6,985,000 ⓘ

Assignee

IBM

Inventors

Joerg G. Appinger (4 patents)
Michael Kessler (3 patents)
Manfred Schmidt (213 patents)

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