Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for thermal testing of semiconductor chip designs

Method and apparatus for thermal testing of semiconductor chip designs

US Patent 7191413 · Granted Mar 13, 2007

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for obfuscating a circuit design2023
Methods for engineering integrated circuit design and development2023
Systems and methods for obfuscating a circuit design2022
Methods for engineering integrated circuit design and development2021
Systems and methods for obfuscating a circuit design2020
Method and apparatus for integrated circuit monitoring and prevention of electro2020
Methods for engineering integrated circuit design and development2019
Systems for engineering integrated circuit design and development2019
Systems and methods for obfuscating a circuit design2019
Thermal mitigation based on predicted temperatures2019
Temporal temperature sensor position offset error correction2019
Thermal mitigation of multi-core processor2018