Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Power assisted automatic supervised classifier creation tool for semiconductor defects

Power assisted automatic supervised classifier creation tool for semiconductor defects

US Patent 6999614 · Granted Feb 14, 2006

Estimated economic value: $14,879,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System, apparatus and method for conducting and monitoring computer-and-sensor b2024
Artificial intelligence driven assessment and feedback tool2023
System and method for generation of wafer inspection critical areas2022
Synchronizing wireless sensor data and video2021
Shape metric based scoring of wafer locations2020
System and method for generation of wafer inspection critical areas2020
Wireless sensor device and software system for measuring linear position of a ro2020
Criticality analysis augmented process window qualification sampling2019
Virtual inspection systems with multiple modes2019
Image based specimen process control2019
Defect sensitivity of semiconductor wafer inspectors using design data with wafe2018
Reducing registration and design vicinity induced noise for intra-die inspection2018