Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies

Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies

US Patent 6933730 · Granted Aug 23, 2005

Estimated economic value: $6,968,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Optical power density control in fiber-coupled laser2020
Frequency-converted optical beams having adjustable beam characteristics2020
Diode laser electrical isolation system2010
Method and apparatus for manufacturing and probing test probe access structures 2009
Method and apparatus for manufacturing and probing printed circuit board test ac2009
Boundary-Scan methods and apparatus2008
Testing target resistances in circuit assemblies2008
Methods and apparatus for non-contact testing and diagnosing of open connections2008
Method and apparatus for determining probing locations for a printed circuit boa2008
Printed circuit board test access point structures and method for making the sam2007
Methods and apparatus for unpowered testing of open connections on power and gro2007
Method and apparatus for engineering a testability interposer for testing socket2007