Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scanning electron microscope

Scanning electron microscope

US Patent 6897445 · Granted May 24, 2005

Estimated economic value: $73,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Microstructure evaluation system and sample image imaging method2025
Image processor, method for generating pattern using self-organizing lithographi2020
Mass spectrometer and mass analyzing method for efficiently ionizing a sample wi2017
Mass spectrometer2016
Sample preparation container2016
Component analyzer2015
Mass spectrometer and mass analyzing method2015
Mass spectrometer2015
Mass spectrometer and mass spectrometry2015
Mass spectrometer2015
Method and apparatus for monitoring cross-sectional shape of a pattern formed on2014
Method and apparatus for creating imaging recipe2014