Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for distributed testing of electronic devices

Method and system for distributed testing of electronic devices

US Patent 6892328 · Granted May 10, 2005

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for testing a fully buffered memory module2009
Method and system for test data capture and compression for electronic device an2006
Method and system for test data capture and compression for electronic device an2006
Method and system for testing RAMBUS memory modules2002
Method and system for testing rambus memory modules2001
Method and system for automatic synchronous memory identification2001
Method and system for automatic synchronous memory identification2001
Programmable pulse generator2000
Programmable pulse generator2000
Programmable pulse generator2000
Tester systems2000
Tester systems2000