{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Apparatus and method for inspecting surface of semiconductor wafer or the like", "item": "https://www.patentleaderboard.com/patent/6798504"}]}
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Home › Apparatus and method for inspecting surface of semiconductor wafer or the like

Apparatus and method for inspecting surface of semiconductor wafer or the like

US Patent 6798504 · Granted Sep 28, 2004

Estimated economic value: $171,000 ⓘ

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