Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Self-test for leakage current of driver/receiver stages

Self-test for leakage current of driver/receiver stages

US Patent 6774656 · Granted Aug 10, 2004

Estimated economic value: $6,982,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Testing a single chip in a wafer probing system2025
Testing a single chip in a wafer probing system2023
Logic built-in self-test of an electronic circuit2023
Device for positioning a semiconductor die in a wafer prober2022
Integrated circuit with optical tunnel2022
Stressing integrated circuits using a radiation source2021
On-chip hardware-controlled window strobing2019
On-chip hardware-controlled window strobing2019
Multi-core dynamic frequency control system2018
Multi-core dynamic frequency control system2018
Method for electrical testing of a 3-D chip stack2018
Layout effect characterization for integrated circuits2018