Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Confocal 3D inspection system and process

Confocal 3D inspection system and process

US Patent 6731383 · Granted May 4, 2004

Estimated economic value: $3,891,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automated wafer defect inspection system and a process of performing such inspec2016
Automated wafer defect inspection system and a process of performing such inspec2016
Coating detection on transparent sheet material2015
Optical coherence tomography imaging2013
Defect detection on optical fiber specimen using 3D surface data2012
Optical coherence tomography imaging2012
Wafer holding mechanism2012
Product setup sharing for multiple inspection systems2011
Edge inspection2010
System for generating camera triggers2010
Automated wafer defect inspection system and a process of performing such inspec2010
Wafer holding mechanism2010