Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for testing semiconductor devices using improved testing sequence

Method and apparatus for testing semiconductor devices using improved testing sequence

US Patent 6646461 · Granted Nov 11, 2003

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor memory device with built-in self test circuit operating at high ra2006
Data storage apparatus and data measuring apparatus2006
Semiconductor device capable of shortening test time and suppressing increase in2005
Semiconductor integrated circuit2005
Semiconductor device provided with memory chips2004
Semiconductor module2004
Semiconductor device that can have a defective bit found during or after packagi2003
Semiconductor testing apparatus for testing semiconductor device including built2003
Semiconductor device and method for operating the same2002
Repair analysis circuit for redundancy, redundant repairing method, and semicond2002
Semiconductor testing apparatus for testing semiconductor device including built2001
Image display device2000