Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Reduced cost, high speed integrated circuit test arrangement

Reduced cost, high speed integrated circuit test arrangement

US Patent 6617872 · Granted Sep 9, 2003

Estimated economic value: $16,608,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for eye-safe transmittal of electrical power in vehicles us2011
Method and apparatus for phostonic stack system for vehicle control/sense2011
Chip to chip optic alleys and method2009
Backplane wire and noise eliminator tube2005
Backplane wire and noise eliminator tube2004
Reduced cost, high speed circuit test arrangement2003
Method and apparatus for optically switching data2003
High-speed clock circuit for semiconductor memory device2001
Synchronous data storage system having re-drive circuits for reduced signal line2001
Synchronous memory and data processing system having a programmable burst order2001
Synchronous dynamic random access memory and data processing system using an add2001
Data processing system having a synchronous memory with an output circuit which 2001