Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scanning probe microscope with probe integrated in an optical system

Scanning probe microscope with probe integrated in an optical system

US Patent 6545263 · Granted Apr 8, 2003

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and device for determining an optimized control strategy of a mobile agen2025
Method for removing a particle from a mask system2023
Optical arrangement and method for correcting centration errors and/or angle err2023
Adapter for use with a sample holder, and method for arranging a sample in a det2023
Method and assembly for characterizing a mask or a wafer for microlithography2022
Lithography apparatus comprising a plurality of individually controllable write 2021
Multi-way prism2020
Applications of adaptive optics in microscopy2010
Method for improving depth discrimination in optical reproduction systems2008
Arrangement in the illumination beam path of a laser scanning microscope2007
Assembly for increasing the depth discrimination of an optical imaging system2004
Applications of adaptive optics in microscopy2004