Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Inductor recognition method, layout inspection method, computer readable recording medium in which a layout inspection program is recorded and process for a semiconductor device

Inductor recognition method, layout inspection method, computer readable recording medium in which a layout inspection program is recorded and process for a semiconductor device

US Patent 6500722 · Granted Dec 31, 2002

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Frac plug and method for manufacturing same, and method for sealing borehole2025
Semiconductor devices including protruding insulation portions between active fi2025
Semiconductor process modeling system and method2025
Method of manufacturing semiconductor device2025
Semiconductor devices including protruding insulation portions between active fi2024
Semiconductor fabrication process and method of optimizing the same2023
Semiconductor device having stacked structure with two-dimensional atomic layer2023
Display driver IC for low voltage signal conversion and electronic device compri2023
Field effect transistor with channel layer with atomic layer, and semiconductor 2022
Semiconductor devices including field effect transistors and methods of forming 2020
Semiconductor devices including protruding insulation portions between active fi2020
Method of fabricating pattern structure2020