Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for minimizing total test time for testing factories

Method for minimizing total test time for testing factories

US Patent 6480794 · Granted Nov 12, 2002

Estimated economic value: $3,179,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Vessel automatic berthing wireless charging integrated system and operating meth2024
Wafer transferring device2021
Video control system, display system control device and video controlling method2013
Method for making chip resistor components2011
Automated supply management method for dynamically fulfilling a customer request2008
Algorithms tunning for dynamic lot dispatching in wafer and chip probing2005
Method and system for efficiently coordinating orders with product materials pro2005
Microelectronic fabrication die electrical test method providing enhanced microe2004
System for validating and monitoring semiconductor testing tools2004
Method for automatic scheduling of production plan2002
Method for automatic scheduling of production plan2002
Method for automatic scheduling of production plan2002