Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6787375 | Microelectronic fabrication die electrical test method providing enhanced microelectronic fabrication die electrical test efficiency | Yung-Min Cheng, Chun-Tsung Yang, Juei-Feng Hsu | 2004-09-07 |
| 6724211 | System for validating and monitoring semiconductor testing tools | Shun-An Chen, Li-Chung Lin, Yung-Min Cheng, Ming-Hui Lin, Hsin-Hom Chen +1 more | 2004-04-20 |
| 6480794 | Method for minimizing total test time for testing factories | Ming-Hsiu Hsieh, Fu-Kang Lai, Wen-Feng Wu, Yi-Hsin Chan, Yi-Chin Hsu | 2002-11-12 |
| 6356797 | Method for automatic scheduling of production plan | Ming-Hsiu Hsieh, Wen-Feng Wu, Min-Huey Tsai, Lieh-Chang Tai | 2002-03-12 |