Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for testing a bit cell in a memory array

Method and system for testing a bit cell in a memory array

US Patent 6341091 · Granted Jan 22, 2002

Estimated economic value: $112,447,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Precision battery energy measuring system2022
Precision current sensing using low cost sense resistance2021
Media-compatible electrically isolated pressure sensor for high temperature appl2014
Media-compatible electrically isolated pressure sensor for high temperature appl2012
Media-compatible electrically isolated pressure sensor for high temperature appl2010
Patterned plasma treatment to improve distribution of underfill material2009
Patterned plasma treatment to improve distribution of underfill material2006
Method and system for flip chip packaging2005
Optical coupling for a flip chip optoelectronic assembly2005
Flip-chip device strengthened by substrate metal ring2004
Contact structure for reliable metallic interconnection2004
Signal processing circuit which provides for a temperature dependent voltage sou2000