Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of quality control in semiconductor device fabrication

Method of quality control in semiconductor device fabrication

US Patent 6238939 · Granted May 29, 2001

Estimated economic value: $2,519,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Wall module incorporating cellular concrete in a stacking structural steel wall 2021
Stacked structural steel wall trusses2020
Constructing multi-story buildings using stacked structural steel wall trusses2020
Floor shelf for multi-story buildings using stacked structural steel wall trusse2020
Floor panel for use in multi-story buildings using stacked structural steel wall2020
Semiconductor substrate processing apparatus including uniformity baffles2019
Imaging of crystalline defects2019
Supporting mechanism for a papermaking machine dewatering blade2019
Iterative defect filtering process2018
System for electrical measurements of objects in a vacuumed environment2018
Updating of a recipe for evaluating a manufacturing stage of an electrical circu2018
Static dissipative fluid conveying coupler and methods of assembling the same2017