{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Circuits for testing memory devices having direct access test mode and methods for testing the same", "item": "https://www.patentleaderboard.com/patent/6141271"}]}
Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Circuits for testing memory devices having direct access test mode and methods for testing the same

Circuits for testing memory devices having direct access test mode and methods for testing the same

US Patent 6141271 · Granted Oct 31, 2000

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Memory device having row driver circuits for reducing leakage currents during po2025
Memory core characteristic screening method and system thereof2025
Semiconductor integrated circuit2025
Memory interface circuitry and built-in self-testing method2024
Signal synchronization adjustment method and signal synchronization adjustment c2024
Internal latch circuit and method for generating latch signal thereof2021
Memory system controlling peak current generation for a plurality of memories by2017
Memory system controlling peak current generation for a plurality of memories by2016
Method for receiving data2015
Method of writing data to a memory2015
Non-volatile memory device with high speed operation and lower power consumption2014
Devices and methods for controlling active termination resistors in a memory sys2013