Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for obtaining transfer characteristics of a device under test

Method and apparatus for obtaining transfer characteristics of a device under test

US Patent 6097194 · Granted Aug 1, 2000

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for inspecting and integrated circuit by measuring voltage 2004
Method for inspecting an integrated circuit by measuring a voltage drop in a sup2001
Digital transmission system with symbol encoding which maximizes the signal ampl1999
Receiver and demodulator for phase or frequency modulated signals1998
Method of reconstructing an image in a particle-optical apparatus1998
Method for particle wave reconstruction in a particle-optical apparatus1997
Method of correcting erroneous values of samples of an equidistantly sampled sig1991