Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6788089 | Method and apparatus for inspecting and integrated circuit by measuring voltage on a signal line | Johannes P. M. Van Lammeren | 2004-09-07 |
| 6239604 | Method for inspecting an integrated circuit by measuring a voltage drop in a supply line of sub-circuit thereof | Johannes P. M. Van Lammeren | 2001-05-29 |
| 6097194 | Method and apparatus for obtaining transfer characteristics of a device under test | Gerardus P. H. Seuren, Marc T. Looijer, Augustus J. E. M. Janssen | 2000-08-01 |