Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Detecting method of impurity concentration in crystal, method for producing single crystal and apparatus for the pull-up of a single crystal

Detecting method of impurity concentration in crystal, method for producing single crystal and apparatus for the pull-up of a single crystal

US Patent 6019837 · Granted Feb 1, 2000

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Short circuit detection device for rotating electrical machine2025
Short circuit detection device and short circuit detection method2024
Short circuit detection device, and short circuit detection method for rotating 2023
Electric pump apparatus2022
Thermal processing method for silicon wafer2021
Silicon wafer2020
Nitriding process method of steel member2019
Nitrided component2019
Manufacturing method of nitrided steel member2018
Nitrided steel member and manufacturing method thereof2017
Active region containing nanodots (also referred to as “quantum dots”) in mother2017
Nitrided steel member and manufacturing method thereof2017