Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for improving the operation of oscillating mode atomic force microscopes

Method for improving the operation of oscillating mode atomic force microscopes

US Patent 6008489 · Granted Dec 28, 1999

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Scanning stylus atomic force microscope with cantilever tracking and optical acc2012
High resolution surface potential microscope2012
System for wide frequency dynamic nanomechanical analysis2009
System for wide frequency dynamic nanomechanical analysis2006
Method and apparatus for atomic force microscopy2003
Scan control for scanning probe microscopes2002
Feedback control for scanning tunnel microscopes2001
Capacitance atomic force microscopes and methods of operating such microscopes2001
Scanning stylus atomic force microscope with cantilever tracking and optical acc2000
Tapping atomic force microscope with phase or frequency detection2000
Scanning probe optical microscope using a solid immersion lens1999
Method and apparatus for obtaining improved vertical metrology measurements1999