Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits

Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits

US Patent 6002426 · Granted Dec 14, 1999

Estimated economic value: $1,195,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Modular space transformer for fine pitch vertical probing applications2013
Probe head structure for probe test cards2012
Cantilever probe card2010
Direct attachment of coaxial cables2008
Method and apparatus for probe tip cleaning and shaping pad2005
Alignment guide and signal transmission apparatus and method for spring contact 2002