Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6002426 | Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits | Gerald W. Back | 1999-12-14 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6002426 | Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits | Gerald W. Back | 1999-12-14 |