Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test connecting device including testkey and probe card for use in the testing of integrated circuits

Test connecting device including testkey and probe card for use in the testing of integrated circuits

US Patent 5949240 · Granted Sep 7, 1999

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method of forming a test key architecture2000
Method for measuring current density in a semiconductor device with kink effect2000
Method for measuring the kink effect of a semiconductor device2000