Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test structure for dielectric film evaluation

Test structure for dielectric film evaluation

US Patent 5841164 · Granted Nov 24, 1998

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor device unlikely to make incorrect determination of fuse blow2005
Semiconductor memory module2004
Phase comparator accurately comparing phases of two clock signals and clock gene2004
Semiconductor integrated circuit with reduction of self refresh current2003
Semiconductor device capable of internally adjusting delayed amount of a clock s2003
Semiconductor memory device with a rapid packet data input, capable of operation2003
Semiconductor integrated circuit capable of readily adjusting circuit characteri2002
Semiconductor memory device with a rapid packet data input, capable of operation2001
Constant current/constant voltage generation circuit with reduced noise upon swi2001
Semiconductor test structure for estimating defects at isolation edge and test m2000
Semiconductor device1999
Semiconductor device1999