Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6040199 | Semiconductor test structure for estimating defects at isolation edge and test method using the same | Masahiro Sekine | 2000-03-21 |
| 5874772 | Semiconductor device | Mitsunori Tsujino | 1999-02-23 |
| 5841164 | Test structure for dielectric film evaluation | Mitsunori Tsujino | 1998-11-24 |
| 5786689 | Apparatus including a measurement time counting device for measuring an electrical characteristic of semiconductor | — | 1998-07-28 |
| 5621222 | Superlattice semiconductor device | — | 1997-04-15 |
| 5594349 | Dielecrtric breakdown prediction apparatus and method, and dielectric breakdown life-time prediction apparatus and method | — | 1997-01-14 |
| 5420513 | Dielectric breakdown prediction and dielectric breakdown life-time prediction using iterative voltage step stressing | — | 1995-05-30 |
| 5266892 | Method of measuring interface state density distribution in MIS structure | — | 1993-11-30 |
| 5114865 | Method of manufacturing a solid-state image sensing device having an overflow drain structure | — | 1992-05-19 |
| 5086010 | Method for manufacturing solid state image sensing device formed of charge coupled devices on side surfaces of trenches | — | 1992-02-04 |
| 5051798 | Solid state image sensing device having an overflow drain structure | — | 1991-09-24 |
| 5032786 | Method of a measuring physical properties of buried channel | — | 1991-07-16 |
| 5029321 | Solid state image sensing device formed of charge coupled devices | — | 1991-07-02 |
| 4933731 | Superlattice imaging device | — | 1990-06-12 |