Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for testing the connections between an integrated circuit and a printed circuit board

Apparatus and method for testing the connections between an integrated circuit and a printed circuit board

US Patent 5818251 · Granted Oct 6, 1998

Estimated economic value: $2,981,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Dynamic configuration of modulation and demodulation2018
Dynamic configuration of modulation and demodulation2016
Integrated digital signal processor/general purpose CPU with shared internal mem2009
Method and apparatus for waking up a computer system via a parallel port1999
Integrated digital signal processor/general purpose CPU with shared internal mem1997
Integrated data processing system including CPU core and parallel, independently1997
Integrated CPU core and parallel, independently operating DSP module and time-cr1996
Monitoring control flow in a microprocessor1993
High resolution, multi-frequency digital phase-locked loop1993