Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Combined interferometer/ellipsometer for measuring small spacings

Combined interferometer/ellipsometer for measuring small spacings

US Patent 5793480 · Granted Aug 11, 1998

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Ultralow expansion titania-silica glass2021
Near infrared shielding and laser-resistant window2019
Apparatus and method for the determination of the absolute coefficient of therma2019
Ultralow expansion titania-silica glass2019
Doped silica-titania glass having low expansivity and methods of making the same2018
Doped ultra-low expansion glass and methods for annealing the same2018
Ultralow expansion glass2018
Ultralow expansion titania-silica glass2017
Doped ultra-low expansion glass and methods for making the same2017
High hydroxyl TiO2-SiO2 glass2017
Ultralow expansion glass2016
Boron-doped titania-silica glass having very low CTE slope2016