Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Testing and repair of wide I/O semiconductor memory devices designed for testing

Testing and repair of wide I/O semiconductor memory devices designed for testing

US Patent 5706234 · Granted Jan 6, 1998

Estimated economic value: $17,596,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Apparatuses and methods for enhanced metadata support2025
Apparatuses and methods for enhanced metadata support2025
Apparatuses and methods for single-pass access of ECC information, metadata info2025
Apparatuses and methods for configurable ECC modes2025
Row clear features for memory devices and associated methods and systems2025
Techniques for flexible self-refresh of memory arrays2025
Apparatuses and methods for die replacement in stacked memory2025
Semiconductor device with modified access and associated methods and systems2025
Metadata implementation for memory devices2025
Memory device clock swapping2025
Adjusting refresh rate during self-refresh state2024
Synchronous input buffer control using a ripple counter2024