Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Absolute interferometer measuring process and apparatus having a measuring interferometer, control interferometer and tunable laser

Absolute interferometer measuring process and apparatus having a measuring interferometer, control interferometer and tunable laser

US Patent 5631736 · Granted May 20, 1997

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Filter element for filtration and dehumidification of a gas2023
Package comprising a substrate, an integrated device, and an encapsulation layer2023
Hollow filter element, in particular for gas filtration2022
Stacked modules2022
Filter element, in particular for gas filtration2021
Annular filter element, in particular for gas filtration2020
Filter Element, in Particular for Gas Filtration, and filter device2020
Fuel filter2020
Operating method for a filter system and filter system2020
Filter element with filter bellows2019
Brake dust collector for motor vehicles2016
Method for producing a ceramic filter element2016