Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Circuit design for point-to-point chip for high speed testing

Circuit design for point-to-point chip for high speed testing

US Patent 5532983 · Granted Jul 2, 1996

Estimated economic value: $53,654,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Van window arrangement2017
Van roof2017
Van passenger windshield2017
Sensor and interlock on an industrial vehicle2007
Integrated circuit die and/or package having a variable pitch contact array for 2006
Integrated circuit die and/or package having a variable pitch contact array for 2003
Power machine with valve mount for valve assembly2002
Hand/foot selector for electronic controls on a skid steer loader2001
Keyless ignition system with washout feature2001
Traction lock/momentary override2001
Short power signal path integrated circuit package1999
Intelligent attachment to a power tool1999