Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Surface inspection and characterization system and process

Surface inspection and characterization system and process

US Patent 5406082 · Granted Apr 11, 1995

Estimated economic value: $2,409,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods of treating patients suffering from a disease condition or disorder that2025
Auto-injector apparatus2022
Medicament delivery devices2022
Hemispherical scanning optical scatterometer2017
Methods and apparatus for detecting defects in an object of interest2017
Device and method for subaperture stray light detection and diagnosis2015
Apparatus and method for allowing display modules to communicate information abo2011
Relaxation modulus sensor, structure incorporating same, and method for use of s2009
Light duty bearing assembly2006
Particle deposition system with enhanced speed and diameter accuracy2004
Method and apparatus for classifying defects occurring at or near a surface of a2004
Wafer inspection system for distinguishing pits and particles2003