Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method of rapidly measuring hemispherical scattered or radiated light

Apparatus and method of rapidly measuring hemispherical scattered or radiated light

US Patent 5313542 · Granted May 17, 1994

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods for determining error in an interferometry system2017
Interferometric system with reduced vibration sensitivity and related method2011
High resolution three dimensional topography using a flatbed scanner2010
Scanning simultaneous phase-shifting interferometer2009
Simultaneous phase shifting module for use in interferometry2009
Spherical scattering-light device for simultaneous phase and intensity measureme2007
Process of acquiring with an X=Y scannable array camera light emanted from a sub1998
Apparatus for measuring reflected light utilizing spherically arranged optical f1997
Apparatus for collecting light and its method of manufacture1997
Process of reconstructing a single data profile of rapidly measured hemispherica1995