Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9534883 | Methods for determining error in an interferometry system | Piotr Szwaykowski | 2017-01-03 |
| 8004687 | Interferometric system with reduced vibration sensitivity and related method | Piotr Szwaykowski, Federick N. Bushroe | 2011-08-23 |
| 7808654 | High resolution three dimensional topography using a flatbed scanner | — | 2010-10-05 |
| 7561279 | Scanning simultaneous phase-shifting interferometer | Piotr Szwaykowski | 2009-07-14 |
| 7483145 | Simultaneous phase shifting module for use in interferometry | Piotr Szwaykowski, Frederick N. Bushroe | 2009-01-27 |
| 7256895 | Spherical scattering-light device for simultaneous phase and intensity measurements | — | 2007-08-14 |
| 5729640 | Process of acquiring with an X=Y scannable array camera light emanted from a subject | — | 1998-03-17 |
| 5640246 | Apparatus for measuring reflected light utilizing spherically arranged optical fibers | — | 1997-06-17 |
| 5615294 | Apparatus for collecting light and its method of manufacture | — | 1997-03-25 |
| 5475617 | Process of reconstructing a single data profile of rapidly measured hemispherical scattered or radiated light | — | 1995-12-12 |
| 5313542 | Apparatus and method of rapidly measuring hemispherical scattered or radiated light | — | 1994-05-17 |