Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for generating test waveforms to be applied to a device under test

Method and apparatus for generating test waveforms to be applied to a device under test

US Patent 5293080 · Granted Mar 8, 1994

Estimated economic value: $12,252,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Secondary battery2019
Secondary battery-mounted circuit chip and manufacturing method thereof2018
Evaluation apparatus and evaluation method of sheet type cell2018
Secondary battery2018
Electrode structure of solid type secondary battery2018
Repair apparatus of sheet type cell2017
Semiconductor probe, testing device and testing method for testing quantum batte2017
Single layer secondary battery having a folded structure2017
Charging/discharging device2017
Testing device and testing method for quantum battery using semiconductor probe2015
Information processing apparatus having printer driver and sheet parameter setti2011
Information processing apparatus having printer driver and sheet parameter setti2011